Diodes Incorporated — Analog and discrete power solutions
SOT363

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2N7002DW

DUAL N-CHANNEL ENHANCEMENT MODE MOSFET

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Description

This MOSFET has been designed to minimize the on-state resistance (RDS(ON)) and yet maintain superior switching performance, making it ideal for high-efficiency power management applications.

Feature(s)

  • Dual N-Channel MOSFET
  • Low On-Resistance
  • Low Gate Threshold Voltage
  • Low Input Capacitance
  • Fast Switching Speed
  • Low Input/Output Leakage
  • Ultra-Small Surface Mount Package
  • Totally Lead-Free & Fully RoHS Compliant (Notes 1 & 2)
  • Halogen- and Antimony-Free. “Green” Device (Note 3)
  • For automotive applications requiring specific change
    control (i.e.: parts qualified to AEC-Q100/101/200, PPAP
    capable, and manufactured in IATF 16949 certified facilities),
    please refer to the related automotive grade (Q-suffix) part.
  • A listing can be found at
    https://www.diodes.com/products/automotive
  • This part is qualified to JEDEC standards (as references in
    AEC-Q) for High Reliability.
    https://www.diodes.com/quality/product-definitions/
  • An Automotive-Compliant Part is Available Under Separate
    Datasheet (2N7002DWQ)

Application(s)

  • Motor Controls
  • Power Management Functions

Product Specifications

Product Parameters

AEC Qualified Yes
Compliance (Only Automotive(Q) supports PPAP) Standard
Polarity N+N
ESD Diodes (Y|N) No
|VDS| (V) 60 V
|VGS| (±V) 20 ±V
|IDS| @TA = +25°C (A) 0.23
PD @TA = +25°C (W) 0.31
RDS(ON)Max@ VGS(10V)(mΩ) 13500 mΩ
RDS(ON)Max@ VGS(4.5V)(mΩ) 7500 @5V mΩ
|VGS(TH)| Max (V) 2 V
CISS Typ (pF) 22 @ 25V pF

Related Content

Packages

Technical Documents

SPICE Model

Recommended Soldering Techniques

TN1.pdf

RoHS CofC

Product Change Notices (PCNs)

A PCN may only apply to specific orderable part numbers in this datasheet. Please refer to the corresponding PCN to see the exact orderable part number(s) affected.

PCN # Issue Date Implementation Date Subject
PCN-2458 2020-07-01 2020-10-01 Qualification of Assembly & Test Site Transfer, and Additional Assembly & Test Site for Select Discrete Products
PCN-2425 2019-10-04 2020-01-04 Qualification of Additional Wafer Solderable Front Metal Plating, Back Grinding and Back Metal Process Source, and
Additional Wafer Source for Select Products.
PCN-2403 2019-03-25 2019-06-19 Qualification of Additional Wafer Solderable Front Metal Plating, Back Grinding and Back Metal Process Source, Additional Wafer Source, or Additional Assembly and Test site for Select Products.
PCN-2389 2019-02-05 2019-08-05 Device End of Life