Diodes Incorporated — Analog and discrete power solutions
PowerDI123

Image shown is for reference only. Actual package may vary. Refer to the product data sheet for package details. PowerDI123

PowerDI123

Image shown is for reference only. Actual package may vary. Refer to the product data sheet for package details. PowerDI123

PowerDI123

Image shown is for reference only. Actual package may vary. Refer to the product data sheet for package details. PowerDI123

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DFLS130

Schottky

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Feature(s)

  • Guard Ring Die Construction for Transient Protection
  • Low Power Loss, High Efficiency
  • High Surge Capability
  • High Current Capability and Low Forward Voltage Drop
  • Lead-Free Finish; RoHS Compliant (Notes 1 & 2)
  • Halogen and Antimony Free. “Green” Device (Note 3)
  • For automotive applications requiring specific change control (i.e.: parts qualified to AEC-Q100/101/104/200, PPAP capable, and manufactured in IATF 16949 certified facilities), please refer to the related automotive grade (Q-suffix) part.
    A listing can be found at https://www.diodes.com/products/automotive/automotiveproducts/.
  • This part is qualified to JEDEC standards (as references in
    AEC-Q) for High Reliability. https://www.diodes.com/quality/product-definitions/

Specifications & Technical Documents

Product Parameters

AEC Qualified Yes
Compliance (Only Automotive Supports PPAP) Standard
Configuration Single
MaximumAverageRectifiedCurrent IO (A) 1 A
@ TerminalTemperature TT (ºC) 120 ºC
Peak RepetitiveReverse VoltageVRRM (V) 30 V
Peak ForwardSurge CurrentIFSM(A) 22 A
Forward VoltageDrop VF(V) 0.42 V
@ IF (A) 1 A
Maximum ReverseCurrent IR (µA) 1000 µA
@ VR (V) 30 V

Related Content

Packages

Technical Documents

SPICE Model

Recommended Soldering Techniques

TN1.pdf

RoHS CofC

Purchase & Availablity

Product Change Notices (PCNs)

A PCN may only apply to specific orderable part numbers in this datasheet. Please refer to the corresponding PCN to see the exact orderable part number(s) affected.

PCN # Issue Date Implementation Date Subject
PCN-2477 2020-08-17 2021-05-09 Additional Wafer Source (GFAB), and Transfer Assembly and Test Site to DiYi
PCN-2459 2020-05-28 2020-11-28 Device End of Life (EOL)