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SD103CWS

Schottky

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Description

This Schottky barrier device has been designed to meet the stringent requirements of automotive applications. The devices are ideally suited to use as: polarity protection diodes, re-circulating diodes, and switching diodes.

Feature(s)

  • Low-Forward Voltage Drop
  • Guard Ring Construction for Transient Protection
  • Negligible Reverse-Recovery Time
  • Low Reverse Capacitance
  • Ultra-Small Surface-Mount Package
  • Totally Lead-Free & Fully RoHS Compliant (Notes 1 & 2)
  • Halogen and Antimony Free. “Green” Device (Note 3)
  • This part is qualified to JEDEC standards (as references in AEC-Q) for High Reliability. https://www.diodes.com/quality/product-definitions/
  • An automotive-compliant part is available under separate datasheet (SD103AWSQ - SD103BWSQ)

Application(s)

  • Polarity protection diodes
  • Re-circulating diodes
  • Switching diodes

Product Specifications

Product Parameters

AEC Qualified Yes
Compliance (Only Automotive supports PPAP) Standard
Configuration Single
Power Rating(mW) 200 mW
Peak RepetitiveReverse VoltageVRRM (V) 20 V
Forward Continuous Current IFM (mA) 350 mA
Forward VoltageDrop VF(V) 0.37
@ IF(mA) 20 mA
Maximum ReverseCurrent IR (µA) 5 µA
@ VR (V) 10 V
Capacitance CTOT Typ (pF) 28 pF

Related Content

Packages

Technical Documents

SPICE Model

Recommended Soldering Techniques

TN1.pdf

RoHS CofC

Product Change Notices (PCNs)

A PCN may only apply to specific orderable part numbers in this datasheet. Please refer to the corresponding PCN to see the exact orderable part number(s) affected.

PCN # Issue Date Implementation Date Subject
PCN-2690 2024-05-29 2024-08-29 Qualification of Diodes’ subcontractor Eris Technology Corporation (Eris) in Taoyuan, Taiwan as Additional Assembly & Test Site and Diodes internal JKFAB in HsinChu, Taiwan as additional wafer source for Select Discrete Products.
PCN-2562 2022-01-04 2022-04-04 Qualification of Additional Wafer Back Grinding and Back Metal Process Source (GFAB) for Select Discrete Products
PCN-2477 2020-08-17 2021-05-09 Additional Wafer Source (GFAB), and Transfer Assembly and Test Site to DiYi
PCN-2459 2020-05-28 2020-11-28 Device End of Life (EOL)
PCN-2461 2020-05-08 2021-04-05 Phenitec Wafer Manufacturing Site Change, Additional Wafer Sources, Wafer Diameter Change, Additional Assembly and Test Site
PCN-2339 2018-06-15 2018-09-15 Qualification of Additional Wafer Source for Select Products